Statistics

Total Visits

Views
Spectral Ellipsometry and Electron Backscatter Diffraction Analyses of Silicon Surfaces Implanted with Silver Ions 100

Total Visits Per Month

July 2024 August 2024 September 2024 October 2024 November 2024 December 2024 January 2025
Spectral Ellipsometry and Electron Backscatter Diffraction Analyses of Silicon Surfaces Implanted with Silver Ions 1 0 2 2 1 2 1

File Visits

Views
SCOPUS00219037-2016-83-1-SID84961201423-a1.pdf 20

Top country views

Views
Russia 76

Top cities views

Views
Kazan 76

Search DSpace


Advanced Search

Browse

My Account

Statistics