An attachment for an optical spectrometer for measuring the concentration profile and coefficient of impurity distribution in a crystal

Abstract

An attachment for an optical spectrometer is described enabling automated measurements of the impurity distribution in a crystal. For analysis of the Nd3+ ion distribution over a LiYF4 crystal, it is shown that the attachment provides a high resolution when obtaining data on the optical quality of a crystal and the impurity concentration profile and reliably determines the impurity distribution coefficient. © 1997 MAEe cyrillic signK Hayκa/Interperiodica Publishing.