dc.contributor.author |
Kazakov B. |
|
dc.contributor.author |
Safiullin G. |
|
dc.contributor.author |
Latypov V. |
|
dc.contributor.author |
Yakovleva Z. |
|
dc.date.accessioned |
2018-09-17T20:16:18Z |
|
dc.date.available |
2018-09-17T20:16:18Z |
|
dc.date.issued |
1997 |
|
dc.identifier.issn |
0020-4412 |
|
dc.identifier.uri |
https://dspace.kpfu.ru/xmlui/handle/net/133265 |
|
dc.description.abstract |
An attachment for an optical spectrometer is described enabling automated measurements of the impurity distribution in a crystal. For analysis of the Nd3+ ion distribution over a LiYF4 crystal, it is shown that the attachment provides a high resolution when obtaining data on the optical quality of a crystal and the impurity concentration profile and reliably determines the impurity distribution coefficient. © 1997 MAEe cyrillic signK Hayκa/Interperiodica Publishing. |
|
dc.relation.ispartofseries |
Instruments and Experimental Techniques |
|
dc.title |
An attachment for an optical spectrometer for measuring the concentration profile and coefficient of impurity distribution in a crystal |
|
dc.type |
Article |
|
dc.relation.ispartofseries-issue |
3 |
|
dc.relation.ispartofseries-volume |
40 |
|
dc.collection |
Публикации сотрудников КФУ |
|
dc.relation.startpage |
429 |
|
dc.source.id |
SCOPUS00204412-1997-40-3-SID27644477596 |
|