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| Probing Wave Functions of Electrically Active Shallow Level Defects by Means of High-Frequency Pulsed ENDOR in Wide Bandgap Materials: SiC, AlN, ZnO, and AgCl | 68 |
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| Probing Wave Functions of Electrically Active Shallow Level Defects by Means of High-Frequency Pulsed ENDOR in Wide Bandgap Materials: SiC, AlN, ZnO, and AgCl | 0 | 5 | 2 | 1 | 2 | 4 | 0 |
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| SCOPUS09379347-2021-SID85112473360-p1.pdf | 2 |
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