| Views | |
|---|---|
| Probing Wave Functions of Electrically Active Shallow Level Defects by Means of High-Frequency Pulsed ENDOR in Wide Bandgap Materials: SiC, AlN, ZnO, and AgCl | 165 |
| May 2026 | June 2026 | July 2026 | August 2026 | September 2026 | October 2026 | November 2026 | |
|---|---|---|---|---|---|---|---|
| Probing Wave Functions of Electrically Active Shallow Level Defects by Means of High-Frequency Pulsed ENDOR in Wide Bandgap Materials: SiC, AlN, ZnO, and AgCl | 8 | 1 | 2 | 12 | 10 | 3 | 2 |
| Views | |
|---|---|
| SCOPUS09379347-2021-SID85112473360-p1.pdf | 7 |
| Views | |
|---|---|
| Russia | 39 |
| Views | |
|---|---|
| Kazan | 39 |