Comprehensive Test Procedure for Digital Instruments and Devices of Automated Versatile Systems

dc.contributor.author	Khusnutdinova E.M.
dc.contributor.author	Pavlov P.P.
dc.contributor.author	Fandeyev V.P.
dc.contributor.author	Khizbullin R.N.
dc.contributor.author	Khusnutdinov A.N.
dc.contributor.author	Cherepen'Kin I.V.
dc.date.accessioned	2021-02-25T06:53:52Z
dc.date.available	2021-02-25T06:53:52Z
dc.date.issued	2020
dc.identifier.issn	1757-8981
dc.identifier.uri	https://dspace.kpfu.ru/xmlui/handle/net/161356
dc.description.abstract	© 2020 IOP Publishing Ltd. All rights reserved. The authors present a comprehensive test procedure for digital devices, based on the calculation and control of two or more characteristics of a binary signal at a control point. The procedure is aimed at how to increase the reliability of performance monitoring and localization of the failure of digital devices as part of automated versatile systems.
dc.relation.ispartofseries	IOP Conference Series: Materials Science and Engineering
dc.title	Comprehensive Test Procedure for Digital Instruments and Devices of Automated Versatile Systems
dc.type	Conference Paper
dc.relation.ispartofseries-issue	1
dc.relation.ispartofseries-volume	915
dc.collection	Публикации сотрудников КФУ
dc.source.id	SCOPUS17578981-2020-915-1-SID85091931934

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Публикации сотрудников КФУ Scopus [24551]
Коллекция содержит публикации сотрудников Казанского федерального (до 2010 года Казанского государственного) университета, проиндексированные в БД Scopus, начиная с 1970г.