Electron paramagnetic resonance of radiation-induced paramagnetic centers in an aerogel

Abstract

Silicon oxide aerogel samples irradiated with x rays at room temperature have been analyzed using the electron paramagnetic resonance method. It has been found that three types of paramagnetic centers appear: paramagnetic centers with a g factor of 2.0035, centers associated with the presence of protons in SiO2 globules, and centers in the adsorbed film on the aerogel surface. The fast (T fast = 30 h) and slow (T slow = 70 d) processes have been revealed in the recombination of these centers. © 2008 Pleiades Publishing, Ltd.