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dc.contributor.author | Kazakov B. | |
dc.contributor.author | Safiullin G. | |
dc.contributor.author | Latypov V. | |
dc.contributor.author | Yakovleva Z. | |
dc.date.accessioned | 2018-09-17T20:16:18Z | |
dc.date.available | 2018-09-17T20:16:18Z | |
dc.date.issued | 1997 | |
dc.identifier.issn | 0020-4412 | |
dc.identifier.uri | https://dspace.kpfu.ru/xmlui/handle/net/133265 | |
dc.description.abstract | An attachment for an optical spectrometer is described enabling automated measurements of the impurity distribution in a crystal. For analysis of the Nd3+ ion distribution over a LiYF4 crystal, it is shown that the attachment provides a high resolution when obtaining data on the optical quality of a crystal and the impurity concentration profile and reliably determines the impurity distribution coefficient. © 1997 MAEe cyrillic signK Hayκa/Interperiodica Publishing. | |
dc.relation.ispartofseries | Instruments and Experimental Techniques | |
dc.title | An attachment for an optical spectrometer for measuring the concentration profile and coefficient of impurity distribution in a crystal | |
dc.type | Article | |
dc.relation.ispartofseries-issue | 3 | |
dc.relation.ispartofseries-volume | 40 | |
dc.collection | Публикации сотрудников КФУ | |
dc.relation.startpage | 429 | |
dc.source.id | SCOPUS00204412-1997-40-3-SID27644477596 |