Khusnutdinova E.M.; Pavlov P.P.; Fandeyev V.P.; Khizbullin R.N.; Khusnutdinov A.N.; Cherepen'Kin I.V.
(2020)
© 2020 IOP Publishing Ltd. All rights reserved. The authors present a comprehensive test procedure for digital devices, based on the calculation and control of two or more characteristics of a binary signal at a control ...