Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra/ by Igor F. Mikhailov, Alexey A. Baturin, and Anton I. Mikhailov.

Baturin  Alexey A.; Mikhailov  Igor F.; Mikhailov  Anton I.

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dc.contributor.author	Mikhailov Igor F.
dc.contributor.author	Baturin Alexey A.
dc.contributor.author	Mikhailov Anton I.
dc.date.accessioned	2024-01-26T21:51:03Z
dc.date.available	2024-01-26T21:51:03Z
dc.date.issued	2020
dc.identifier.citation	Mikhailov и др. Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra - 1 online resource (249 p.) - URL: https://libweb.kpfu.ru/ebsco/pdf/2329686.pdf
dc.identifier.isbn	1527543897
dc.identifier.isbn	9781527543898
dc.identifier.uri	https://dspace.kpfu.ru/xmlui/handle/net/179300
dc.description.abstract	This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spectrum formation. The complex methods for analyzing the material composition by joint spectra of fluorescence, Compton scattering and diffraction proposed here allow for a widening of the area of the application of X-ray methods.The book will be useful for specialists in the field of solid state physi.
dc.language	English
dc.language.iso	en
dc.subject.other	Fluorescence spectroscopy.
dc.subject.other	X-ray spectroscopy.
dc.subject.other	X-rays -- Diffraction.
dc.subject.other	Materials -- Analysis.
dc.subject.other	Electronic books.
dc.title	Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra/ by Igor F. Mikhailov, Alexey A. Baturin, and Anton I. Mikhailov.
dc.type	Book
dc.description.pages	1 online resource (249 p.)
dc.collection	Электронно-библиотечные системы
dc.source.id	EN05CEBSCO05C432030