Mechanisms of dielectric relaxation of hexagonal ice

dc.contributor.author	Khamzin A.A.
dc.contributor.author	Lunev I.V.
dc.contributor.author	Popov I.I.
dc.contributor.author	Greenbaum A.M.
dc.contributor.author	Feldman Y.D.
dc.date.accessioned	2021-02-25T21:01:05Z
dc.date.available	2021-02-25T21:01:05Z
dc.date.issued	2020
dc.identifier.issn	2218-3000
dc.identifier.uri	https://dspace.kpfu.ru/xmlui/handle/net/162883
dc.description.abstract	© 2020 Russian Academy of Natural Science. All rights reserved. The article presents the results of theoretical and experimental studies of the dielectric relaxation of hexagonal ice in a wide temperature range. The model of dielectric relaxation of ice was developed explaining the origin of the dynamic crossovers in relaxation time at high and low temperatures. The results of the model are in agreement with experimental studies and explain the irreproducibility of dielectric experiments at low temperatures.
dc.relation.ispartofseries	Radioelektronika, Nanosistemy, Informacionnye Tehnologii
dc.subject	Cole-Cole relaxation
dc.subject	Dielectric relaxation
dc.subject	Hexagonal ice
dc.subject	Ionic defects
dc.subject	Orientation defects
dc.title	Mechanisms of dielectric relaxation of hexagonal ice
dc.type	Article
dc.relation.ispartofseries-issue	1
dc.relation.ispartofseries-volume	12
dc.collection	Публикации сотрудников КФУ
dc.relation.startpage	87
dc.source.id	SCOPUS22183000-2020-12-1-SID85085771580

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