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dc.contributor.author Kazakov B.
dc.contributor.author Goriev O.
dc.contributor.author Khadiev A.
dc.contributor.author Korableva S.
dc.contributor.author Semashko V.
dc.date.accessioned 2019-01-22T20:55:44Z
dc.date.available 2019-01-22T20:55:44Z
dc.date.issued 2018
dc.identifier.uri https://dspace.kpfu.ru/xmlui/handle/net/149464
dc.description.abstract © 2018 IEEE. The fluorescence intensity ratio technique to the thermal profiling of solid-state laser materials is developed. The temperature distribution inside the excited area of LiY0.8Yb0.2F4: Tm3+(0.2 at.%) crystals during z-scanning was studied.
dc.subject Solid-state active media
dc.subject Thermal effects
dc.subject Thermal sensor
dc.title Thermal profiling of solid-state active media
dc.type Conference Paper
dc.collection Публикации сотрудников КФУ
dc.relation.startpage 59
dc.source.id SCOPUS-2018-SID85052511793


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  • Публикации сотрудников КФУ Scopus [22633]
    Коллекция содержит публикации сотрудников Казанского федерального (до 2010 года Казанского государственного) университета, проиндексированные в БД Scopus, начиная с 1970г.

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