dc.contributor.author | Kazakov B. | |
dc.contributor.author | Goriev O. | |
dc.contributor.author | Khadiev A. | |
dc.contributor.author | Korableva S. | |
dc.contributor.author | Semashko V. | |
dc.date.accessioned | 2019-01-22T20:55:44Z | |
dc.date.available | 2019-01-22T20:55:44Z | |
dc.date.issued | 2018 | |
dc.identifier.uri | https://dspace.kpfu.ru/xmlui/handle/net/149464 | |
dc.description.abstract | © 2018 IEEE. The fluorescence intensity ratio technique to the thermal profiling of solid-state laser materials is developed. The temperature distribution inside the excited area of LiY0.8Yb0.2F4: Tm3+(0.2 at.%) crystals during z-scanning was studied. | |
dc.subject | Solid-state active media | |
dc.subject | Thermal effects | |
dc.subject | Thermal sensor | |
dc.title | Thermal profiling of solid-state active media | |
dc.type | Conference Paper | |
dc.collection | Публикации сотрудников КФУ | |
dc.relation.startpage | 59 | |
dc.source.id | SCOPUS-2018-SID85052511793 |