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dc.contributor.author | Tumakov D. | |
dc.date.accessioned | 2018-09-19T20:44:29Z | |
dc.date.available | 2018-09-19T20:44:29Z | |
dc.date.issued | 2017 | |
dc.identifier.issn | 0972-0871 | |
dc.identifier.uri | https://dspace.kpfu.ru/xmlui/handle/net/143201 | |
dc.description.abstract | © 2017 Pushpa Publishing House, Allahabad, India.Uniqueness of a solution to the problem of reconstruction of the dielectric layer parameters arising during analysis of a scattered field is investigated. The study is concerned with two cases, which include determining refractive index of a dielectric material filling the layer, and determining thickness of the layer. It is concluded that two measurements, conducted at different and “properly chosen” frequencies, are sufficient to provide uniqueness of a solution to the reconstruction problem. | |
dc.relation.ispartofseries | Far East Journal of Mathematical Sciences | |
dc.subject | Dielectric layer | |
dc.subject | Inverse problem | |
dc.subject | Reconstruction of parameters | |
dc.subject | Uniqueness of solution | |
dc.title | On uniqueness of a solution to the problem of reconstruction of homogeneous dielectric layer parameters | |
dc.type | Article | |
dc.relation.ispartofseries-issue | 4 | |
dc.relation.ispartofseries-volume | 101 | |
dc.collection | Публикации сотрудников КФУ | |
dc.relation.startpage | 763 | |
dc.source.id | SCOPUS09720871-2017-101-4-SID85011580138 |