dc.contributor.author |
Tumakov D. |
|
dc.date.accessioned |
2018-09-19T20:44:29Z |
|
dc.date.available |
2018-09-19T20:44:29Z |
|
dc.date.issued |
2017 |
|
dc.identifier.issn |
0972-0871 |
|
dc.identifier.uri |
https://dspace.kpfu.ru/xmlui/handle/net/143201 |
|
dc.description.abstract |
© 2017 Pushpa Publishing House, Allahabad, India.Uniqueness of a solution to the problem of reconstruction of the dielectric layer parameters arising during analysis of a scattered field is investigated. The study is concerned with two cases, which include determining refractive index of a dielectric material filling the layer, and determining thickness of the layer. It is concluded that two measurements, conducted at different and “properly chosen” frequencies, are sufficient to provide uniqueness of a solution to the reconstruction problem. |
|
dc.relation.ispartofseries |
Far East Journal of Mathematical Sciences |
|
dc.subject |
Dielectric layer |
|
dc.subject |
Inverse problem |
|
dc.subject |
Reconstruction of parameters |
|
dc.subject |
Uniqueness of solution |
|
dc.title |
On uniqueness of a solution to the problem of reconstruction of homogeneous dielectric layer parameters |
|
dc.type |
Article |
|
dc.relation.ispartofseries-issue |
4 |
|
dc.relation.ispartofseries-volume |
101 |
|
dc.collection |
Публикации сотрудников КФУ |
|
dc.relation.startpage |
763 |
|
dc.source.id |
SCOPUS09720871-2017-101-4-SID85011580138 |
|