A new approach of recognition of ellipsoidal micro- and nanoparticles on AFM images and determination of their sizes

dc.contributor.author	Akhmadeev A.
dc.contributor.author	Kh Salakhov M.
dc.date.accessioned	2018-09-19T20:42:37Z
dc.date.available	2018-09-19T20:42:37Z
dc.date.issued	2016
dc.identifier.issn	0957-0233
dc.identifier.uri	https://dspace.kpfu.ru/xmlui/handle/net/143161
dc.description.abstract	© 2016 IOP Publishing Ltd.In this work we develop an approach of automatic recognition of ellipsoidal particles on the atomic force microscopy (AFM) image and determination of their size, which is based on image segmentation and the surface approximation by ellipsoids. In addition to the comparative simplicity and rapidity of processing, this method allows us to determine the size of particles, the surface of which is not completely visible on the image. The proposed method showed good results on simulated images including noisy ones. Using this algorithm the size distributions of silica particles on experimental AFM images have been determined.
dc.relation.ispartofseries	Measurement Science and Technology
dc.subject	atomic force microscopy
dc.subject	image segmentation
dc.subject	particle detection
dc.subject	size determination
dc.title	A new approach of recognition of ellipsoidal micro- and nanoparticles on AFM images and determination of their sizes
dc.type	Article
dc.relation.ispartofseries-issue	10
dc.relation.ispartofseries-volume	27
dc.collection	Публикации сотрудников КФУ
dc.source.id	SCOPUS09570233-2016-27-10-SID84989889823

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Коллекция содержит публикации сотрудников Казанского федерального (до 2010 года Казанского государственного) университета, проиндексированные в БД Scopus, начиная с 1970г.