Calculation of the reflection matrix in the plane waveguide by scanning screen method

dc.contributor.author	Aleksandrova I.
dc.contributor.author	Pleshchinskii N.
dc.date.accessioned	2018-09-18T20:35:16Z
dc.date.available	2018-09-18T20:35:16Z
dc.date.issued	2008
dc.identifier.uri	https://dspace.kpfu.ru/xmlui/handle/net/141417
dc.description.abstract	The possibility of calculation of coefficients of the reflection matrix partially describing inhomogeneous in the plane waveguide with metallic sides by bounded number of characteristics of the reflected field is studied. To receive the additional information it is proposed to use a thin conducting screen placed in front of the investigated heterogeneity. © 2008 IEEE.
dc.title	Calculation of the reflection matrix in the plane waveguide by scanning screen method
dc.type	Conference Paper
dc.collection	Публикации сотрудников КФУ
dc.relation.startpage	170
dc.source.id	SCOPUS-2008-SID51749110197

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Публикации сотрудников КФУ Scopus [24551]
Коллекция содержит публикации сотрудников Казанского федерального (до 2010 года Казанского государственного) университета, проиндексированные в БД Scopus, начиная с 1970г.