dc.contributor.author |
Koryukin A. |
|
dc.contributor.author |
Akhmadeev A. |
|
dc.contributor.author |
Salakhov M. |
|
dc.date.accessioned |
2018-09-18T20:24:56Z |
|
dc.date.available |
2018-09-18T20:24:56Z |
|
dc.date.issued |
2013 |
|
dc.identifier.issn |
1742-6588 |
|
dc.identifier.uri |
https://dspace.kpfu.ru/xmlui/handle/net/139649 |
|
dc.description.abstract |
We developed methods for determination of thickness, number of layers and filling fraction of silica particles for synthetic opals. We show that the filling fraction is considerably less than for ideal close-packed structure, which is important for practical and theoretical applications. © Published under licence by IOP Publishing Ltd. |
|
dc.relation.ispartofseries |
Journal of Physics: Conference Series |
|
dc.title |
Methods of characterization of synthetic opal films |
|
dc.type |
Conference Paper |
|
dc.relation.ispartofseries-issue |
1 |
|
dc.relation.ispartofseries-volume |
478 |
|
dc.collection |
Публикации сотрудников КФУ |
|
dc.source.id |
SCOPUS17426588-2013-478-1-SID84891813315 |
|