Testing of multi-output circuits by means of signature analyzer

dc.contributor.author	Stolov Y.
dc.date.accessioned	2018-09-17T20:52:08Z
dc.date.available	2018-09-17T20:52:08Z
dc.date.issued	1993
dc.identifier.issn	0923-8174
dc.identifier.uri	https://dspace.kpfu.ru/xmlui/handle/net/134178
dc.description.abstract	Let a circuit have m outputs, m>1. There are two ways to test this circuit by means of a signature analyzer: use a single input analyzer for each output or use an m-input analyzer to test all outputs simultaneously. The main goal of this letter is to demonstrate that for fault output sequences with small multiplicity of errors and long length the second approach is more effective. © 1993 Kluwer Academic Publishers.
dc.relation.ispartofseries	Journal of Electronic Testing
dc.subject	Data compaction
dc.subject	multiple input analyzer
dc.title	Testing of multi-output circuits by means of signature analyzer
dc.type	Article
dc.relation.ispartofseries-issue	3
dc.relation.ispartofseries-volume	4
dc.collection	Публикации сотрудников КФУ
dc.relation.startpage	283
dc.source.id	SCOPUS09238174-1993-4-3-SID0027644194

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Публикации сотрудников КФУ Scopus [24551]
Коллекция содержит публикации сотрудников Казанского федерального (до 2010 года Казанского государственного) университета, проиндексированные в БД Scopus, начиная с 1970г.