Comments on "optimizing error masking in BIST by output data modification"

dc.contributor.author	Latypov R.
dc.date.accessioned	2018-09-17T20:52:06Z
dc.date.available	2018-09-17T20:52:06Z
dc.date.issued	1991
dc.identifier.issn	0923-8174
dc.identifier.uri	https://dspace.kpfu.ru/xmlui/handle/net/134177
dc.description.abstract	In a recent paper [1] a scheme for reducing error masking probability by modifying the output data before compaction has been proposed. The aim of the present comment is to direct one's attention to another method of modifier construction. The method employs a linear combinational circuit (LCC) as modifier. Such an approach may require little extra hardware. Furthermore, there is an efficient algorithm for finding a modifier. © 1991 Kluwer Academic Publishers.
dc.relation.ispartofseries	Journal of Electronic Testing
dc.subject	Output data compaction
dc.subject	output data modification
dc.subject	Walsh coefficients
dc.title	Comments on "optimizing error masking in BIST by output data modification"
dc.type	Article
dc.relation.ispartofseries-issue	3
dc.relation.ispartofseries-volume	2
dc.collection	Публикации сотрудников КФУ
dc.relation.startpage	307
dc.source.id	SCOPUS09238174-1991-2-3-SID0026207641

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Коллекция содержит публикации сотрудников Казанского федерального (до 2010 года Казанского государственного) университета, проиндексированные в БД Scopus, начиная с 1970г.