Signature analysis of circuits with detection of single faults

dc.contributor.author	Latypov R.
dc.date.accessioned	2018-09-17T20:08:21Z
dc.date.available	2018-09-17T20:08:21Z
dc.date.issued	1997
dc.identifier.issn	0005-2310
dc.identifier.uri	https://dspace.kpfu.ru/xmlui/handle/net/133085
dc.description.abstract	A test system is considered in which the signature analyzer, i.e. the most frequently applied system of built-in testing, is used for compression of the output sequence of a tested device. A system of built-in testing of combinational circuits is suggested that uses a linear sequential machine for compression of the input and output sequence and allows to detect single faults of a circuit implemented in the form of a programmed logic matrix on the basis of perfect disjunctive normal form of the output functions.
dc.relation.ispartofseries	Avtomatika i Telemekhanika
dc.title	Signature analysis of circuits with detection of single faults
dc.type	Article
dc.relation.ispartofseries-issue	5
dc.collection	Публикации сотрудников КФУ
dc.relation.startpage	153
dc.source.id	SCOPUS00052310-1997-5-SID0031131235

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Публикации сотрудников КФУ Scopus [24551]
Коллекция содержит публикации сотрудников Казанского федерального (до 2010 года Казанского государственного) университета, проиндексированные в БД Scopus, начиная с 1970г.