Tuning circuits in systems of built-in testing

Abstract

Systems of built-in testing contain a test generator and a signature analyzer (SA). At last time expedience of the generator and SA selection for testing a given plant has been cleared up. Realization of this requirement assumes the modification possibility of a generator and a SA. Besides, in the case of multi-input SA efficiency of SA application over the fields (GF(2M) (m>1) has been proved. In this case circuits realizing the elements product in these fields are required. A regular tuning structure is suggested for calculation of the product of matrix into vector over the field GF(2). Possible its applications in tuning test generators and SA in systems of built-in testing are shown.