Estimation of parameters of charge carriers in dielectric materials by CELIV method

Abstract

© Published under licence by IOP Publishing Ltd. Measuring the mobility of charge carriers by the time-of-flight method has been used for several decades to study organic semiconductors and dielectrics. Modern research in the field of polymer semiconductor devices focuses on the properties of single- and multi-layer thin-film structures with thicknesses less than 100 nm. Such structures are of considerable interest for research, since they are the basis for organic light-emitting diodes, organic solar cells and other electronic devices.