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Просмотр по автору "Iancu V."

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  • Ciurea M.; Lazanu S.; Stavarache I.; Lepadatu A.; Iancu V.; Mitroi M.; Nigmatullin R.; Baleanu C. (2011)
    The trap parameters of defects in Si/CaF 2 multilayered structures were determined from the analysis of optical charging spectroscopy measurements. Two kinds of maxima were observed. Some of them were rather broad, ...
  • Lepadatu A.; Stavarache I.; Lazanu S.; Iancu V.; Mitroi M.; Nigmatulin R.; Ciurea M. (2010)
    The temperature dependence of the capture coefficients in trapping phenomena is investigated. It is proved that, besides the dependence induced by the thermal velocity of the carriers, the stress-induced traps at the ...

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