Sidorenko A.; Zdravkov V.; Prepelitsa A.; Helbig C.; Luo Y.; Gsell S.; Schreck M.; Klimm S.; Horn S.; Tagirov L.; Tidecks R.
(2003)
We investigated Nb/Ni bilayers prepared by DC magnetron sputtering on glass substrates. The quality of the films was characterized by small-angle X-ray diffraction analysis. The thickness of the layers was determined by ...