Sheludiakov S.; Ahokas J.; Järvinen J.; Vainio O.; Lehtonen L.; Zvezdov D.; Khmelenko V.; Lee D.; Vasiliev S.
(2016)
© 2015, Springer Science+Business Media New York.We report on the measurements of electrons trapped in solid molecular films of H (Formula presented.) , HD, and D (Formula presented.). A narrow ESR line associated with the ...