Browsing by Subject "analog circuits"

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An approach to design-for-testability automation of analogue integrated circuits using OBIST strategy

Mosin S. (2016)

© 2016 IEEE.This paper is mainly focused on the task of design-for-testability (DFT) automation with emphasis on OBIST strategy for analog integrated circuits. The design procedures according to DFT flow are proposed. Three ...
Automated simulation of faults in analog circuits based on parallel paradigm

Mosin S. (2017)

© 2017 IEEE. Fault simulation is very important task for testing and fault diagnostics based on the concept of simulation before test. Catastrophic and parametric faults as well as component tolerances can make strong or ...

Now showing items 1-2 of 2

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