Browsing by Author "Sakharov V."

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  • Investigation of surface layer of polished LiYF4 single crystal 
    Abdulsabirov R.; Korableva S.; Sakharov V.; Tagirov M. (1995)
    Optical microscopy, measurements of microhardness, and electron backscattering have been used to investigate the surface of an LiYF4 single crystal. The depth of the deformed layer after mechanical polishing was found to ...
  • Polishing surface layer of LiYF4 single crystal 
    Abdulsabirov R.; Korableva S.; Sakharov V.; Tagirov M. (1994)
    By using methods of optical microscopy, microhardness and fast electrons diffraction in reflection mode it was determined that after mechanical polishing the depth of distorting layer is about 30 μm. Optimal results for ...

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