Metallic phase in lightly doped La2-x-SrxCuO 4 observed by electron paramagnetic resonance

dc.contributor.author	Shengelaya A.
dc.contributor.author	Bruun M.
dc.contributor.author	Kochelaev B.
dc.contributor.author	Safina A.
dc.contributor.author	Conder K.
dc.contributor.author	Müller K.
dc.date.accessioned	2018-09-17T21:56:33Z
dc.date.available	2018-09-17T21:56:33Z
dc.date.issued	2004
dc.identifier.issn	0031-9007
dc.identifier.uri	https://dspace.kpfu.ru/xmlui/handle/net/135632
dc.description.abstract	The metallic phase in low doping range of x from 0.01 to 0.06 in La 2-xSrxCuO4 was analyzed using narrow electron paramagnetic resonance (EPR) line. It was observed that this line was distinct from the known broad line and both lines were due to probing Mn2+ ions. The narrow lines occurred due to metallic regions in material and its intensity increased exponentially upon cooling below ∼150 K. The results show that intensity of narrow EPR line follows same temperature dependence as in-plane resistivity anisotropy in lightly doped La2-xSr xCuO4 single crystals.
dc.relation.ispartofseries	Physical Review Letters
dc.title	Metallic phase in lightly doped La2-x-SrxCuO 4 observed by electron paramagnetic resonance
dc.type	Article
dc.relation.ispartofseries-issue	1
dc.relation.ispartofseries-volume	93
dc.collection	Публикации сотрудников КФУ
dc.relation.startpage	017001
dc.source.id	SCOPUS00319007-2004-93-1-SID3442886209

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