Stolyarov V.; Remizov S.; Shapiro D.; Pons S.; Vlaic S.; Aubin H.; Baranov D.; Brun C.; Yashina L.; Bozhko S.; Cren T.; Pogosov W.; Roditchev D.
(2017)
© 2017 Author(s). The influence of individual impurities of Fe on the electronic properties of topological insulator Bi 2 Se 3 is studied by Scanning Tunneling Microscopy. The microscope tip is used in order to remotely ...