Электронный архив

Просмотр по автору "Bazarov V."

Просмотр по автору "Bazarov V."

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  • Khaibullin R.; Lopatin O.; Vagizov F.; Bazarov V.; Bakhtin A.; Khaibullin I.; Aktas B. (2003)
    Natural colorless crystals of Ural beryl were implanted at room temperature with 40 keV Fe+ ions with fluences in the range of 0.5-1.5×1017 ion/cm2. As-implanted samples show dark-grey tone due to radiation damage of beryl ...
  • Lyadov N.; Gumarov A.; Valeev V.; Nuzhdin V.; Shustov V.; Bazarov V.; Faizrakhmanov I. (2016)
    © 2016, Pleiades Publishing, Ltd.Thin (about 270 nm) nanocrystalline films of zinc oxide (ZnO) are obtained on quartz substrates using ion sputtering and irradiated with Ag+ ions at an energy of 30 keV and relatively high ...
  • Khaibullin I.; Khaibullin R.; Abdullin S.; Stepanov A.; Osin Y.; Bazarov V.; Kurzin S. (1997)
    The viscosity of the irradiated target as new parameter was introduced in ion implantation physics of organic matter. It was experimentally shown that using this parameter one enables to monitor the process of ion synthesis ...
  • Lyadov N.; Gumarov A.; Valeev V.; Nuzhdin V.; Bazarov V.; Faizrakhmanov I. (2014)
    ZnO and Al2O3 samples implanted with 30-keV silver ions with fluences in the interval (0.25-1.00) × 1017 ions/cm2 are studied by the method of optical photometry in the visible part of the spectrum. The optical transmission ...
  • Bazarov V.; Nuzhdin V.; Valeev V.; Vorobev V.; Osin Y.; Stepanov A. (2016)
    © 2016, Springer Science+Business Media New York.Amorphous silicon (a-Si) produced on surfaces of single-crystal substrates (c-Si) by low-energy low-dose implantation of silver ions is studied by spectral ellipsometry and ...
  • Bazarov V.; Valeev V.; Nuzhdin V.; Osin Y.; Gumarov G.; Stepanov A. (2015)
    © (2015) Trans Tech Publications, Switzerland. Monocrystalline silicon wafers implanted by cobalt ions with energy of 40 keV at a fluence range from 6.6×1012 to 2.5×1017 Co+-ion/cm2 were investigated by optical spectroscopic ...
  • Lyadov N.; Bazarov V.; Vagizov F.; Vakhitov I.; Dulov E.; Kashapov R.; Noskov A.; Khaibullin R.; Shustov V.; Faizrakhmanov I. (2016)
    © 2016 Elsevier B.V. All rights reserved.Thin Fe57 films with the thickness of 120 nm have been prepared on glass substrates by using the ion-beam-assisted deposition technique. X-ray diffraction, electron microdiffraction ...
  • Lyadov N.; Gumarov A.; Kashapov R.; Noskov A.; Valeev V.; Nuzhdin V.; Bazarov V.; Khaibullin R.; Faizrakhmanov I. (2016)
    © 2016, Pleiades Publishing, Ltd. Textured nanocrystalline ZnO thin films are synthesized by ion beam assisted deposition. According to X-ray diffraction data, the crystallite size is ~25 nm. Thin (~15 nm) ZnO layers ...
  • Bazarov V.; Shustov V.; Lyadov N.; Faizrakhmanov I.; Yanilkin I.; Khantimerov S.; Garipov R.; Fatykhov R.; Suleimanov N.; Valeev V. (2019)
    © 2019, Pleiades Publishing, Ltd. Abstract: Results of an investigation of the surface of germanium nanostructured by means of ion implantation are presented. Single-crystalline germanium (c-Ge) plates were irradiated by ...

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