Ciurea M.; Lazanu S.; Stavarache I.; Lepadatu A.; Iancu V.; Mitroi M.; Nigmatullin R.; Baleanu C.
(2011)
The trap parameters of defects in Si/CaF 2 multilayered structures were determined from the analysis of optical charging spectroscopy measurements. Two kinds of maxima were observed. Some of them were rather broad, ...